Intelligent Solution for Next-Generation Industry
Boost smart factory operational efficiency with trend analysis and AI-powered insights
Intelligent Solution for Next-Generation Industry
Boost smart factory operational efficiency with trend analysis and AI-powered insights
Key Features
Key Features
Key Feature 1
Real-Time Sensor Data Acquisition, Analysis, and Automated Process Classification
Continuously gather and analyze data from multiple sensors including cameras, accelerometers, temperature probes, comparing it against reference process data to automatically detect and classify active processes independent of specific equipment.
Equipment-agnostic approach lets you deploy the solution across diverse manufacturing lines and facilities.
Key Feature 1
Real-Time Sensor Data Acquisition, Analysis, and Automated Process Classification
Continuously gather and analyze data from multiple sensors including cameras, accelerometers, temperature probes, comparing it against reference process data to automatically detect and classify active processes independent of specific equipment.
Equipment-agnostic approach lets you deploy the solution across diverse manufacturing lines and facilities.
Key Feature 1
Real-Time Sensor Data Acquisition, Analysis, and Automated Process Classification
Continuously gather and analyze data from multiple sensors including cameras, accelerometers, temperature probes, comparing it against reference process data to automatically detect and classify active processes independent of specific equipment.
Equipment-agnostic approach lets you deploy the solution across diverse manufacturing lines and facilities.
Key Feature 2
AI-Powered Anomaly Detection
Correlates analysis of collected sensor data with live process data to monitor subtle changes, and applies high-precision statistical algorithms to identify both single-event anomalies and long-term pattern shifts in real time.
Detect early signs of equipment anomalies and gradual shifts in process consistency, allowing proactive intervention to prevent unplanned downtime.
Key Feature 2
AI-Powered Anomaly Detection
Correlates analysis of collected sensor data with live process data to monitor subtle changes, and applies high-precision statistical algorithms to identify both single-event anomalies and long-term pattern shifts in real time.
Detect early signs of equipment anomalies and gradual shifts in process consistency, allowing proactive intervention to prevent unplanned downtime.
Key Feature 2
AI-Powered Anomaly Detection
Correlates analysis of collected sensor data with live process data to monitor subtle changes, and applies high-precision statistical algorithms to identify both single-event anomalies and long-term pattern shifts in real time.
Detect early signs of equipment anomalies and gradual shifts in process consistency, allowing proactive intervention to prevent unplanned downtime.
Key Feature 3
Generative AI-Powered Reports and Tailored Insights
Automatically converts analyzed data into clear reports that highlight operational status, trend analyses, and statistical summaries, and Generative AI delivers decision-ready insights.
Customized reports for each facility enable users to maximize operational efficiency and develop effective maintenance strategies.
Key Feature 3
Generative AI-Powered Reports and Tailored Insights
Automatically converts analyzed data into clear reports that highlight operational status, trend analyses, and statistical summaries, and Generative AI delivers decision-ready insights.
Customized reports for each facility enable users to maximize operational efficiency and develop effective maintenance strategies.
Key Feature 3
Generative AI-Powered Reports and Tailored Insights
Automatically converts analyzed data into clear reports that highlight operational status, trend analyses, and statistical summaries, and Generative AI delivers decision-ready insights.
Customized reports for each facility enable users to maximize operational efficiency and develop effective maintenance strategies.
Key Feature 4
Customization of Sensor Inputs and Analytics
Provides built-in support for a wide range of sensor inputs and corresponding analytics, and can be easily extended with add-on modules to meet any site-specific requirements.
Easily implement configurations optimized for equipment or processes requested by customers, enabling support for diverse smart factory environments.
Key Feature 4
Customization of Sensor Inputs and Analytics
Provides built-in support for a wide range of sensor inputs and corresponding analytics, and can be easily extended with add-on modules to meet any site-specific requirements.
Easily implement configurations optimized for equipment or processes requested by customers, enabling support for diverse smart factory environments.
Key Feature 4
Customization of Sensor Inputs and Analytics
Provides built-in support for a wide range of sensor inputs and corresponding analytics, and can be easily extended with add-on modules to meet any site-specific requirements.
Easily implement configurations optimized for equipment or processes requested by customers, enabling support for diverse smart factory environments.
Applications
Applications
01
Wafer Cleaning Equipment Monitoring
Detect and classify recipes using only sensor data, with no equipment integration required
Track the precise position of chamber components like nozzles, arms, and chucks
Trigger urgent alarms upon abnormal events
Analyze micro-level variations in process and equipment operations and assess consistency
Automatically generate operational reports based on analysis results
02
Wafer Surface Color Pattern Analysis
Detect process start and end in real time
Analyze wafer surface color patterns to monitor for anomalies
Integrate extracted color pattern data with FDC systems
Support up to eight chambers using a single GPU embedded within the NVR
01
Wafer Cleaning Equipment Monitoring
Detect and classify recipes using only sensor data, with no equipment integration required
Track the precise position of chamber components like nozzles, arms, and chucks
Trigger urgent alarms upon abnormal events
Analyze micro-level variations in process and equipment operations and assess consistency
Automatically generate operational reports based on analysis results
02
Wafer Surface Color Pattern Analysis
Detect process start and end in real time
Analyze wafer surface color patterns to monitor for anomalies
Integrate extracted color pattern data with FDC systems
Support up to eight chambers using a single GPU embedded within the NVR
01
Wafer Cleaning Equipment Monitoring
Detect and classify recipes using only sensor data, with no equipment integration required
Track the precise position of chamber components like nozzles, arms, and chucks
Trigger urgent alarms upon abnormal events
Analyze micro-level variations in process and equipment operations and assess consistency
Automatically generate operational reports based on analysis results
02
Wafer Surface Color Pattern Analysis
Detect process start and end in real time
Analyze wafer surface color patterns to monitor for anomalies
Integrate extracted color pattern data with FDC systems
Support up to eight chambers using a single GPU embedded within the NVR
References
References
